AOI金線檢測機用于檢測封裝芯片上的金線連接質量和準確性。使用高分辨率2D/3D相機和AI圖像處理算法，對封裝芯片上的金線連接進行快速、精確的檢測和分析。能夠檢測金線的焊接情況、位置、高度、偏移等參數，識別多種異?；蛉毕荩绾附硬涣?、斷裂、偏移等問題。通過及時發(fā)現和修復金線連接的問題，有助于提高封裝芯片的質量和可靠性，降低芯片的不良率。
漏打線、打錯線、飛線、打雙線、線弧不良、金線殘留、金線短路、焊球脫落、魚尾脫落、焊球XY尺寸、焊球偏移、魚尾XY尺寸、魚尾偏移、有線無球、電容脫落、電容偏移、立碑、電容臟污、驅動C破損、驅動IC脫落、驅動IC臟污、感光芯片刮傷、感光芯片破損、感光芯片臟污。
Missed Bonds, Misplaced Bonds, Wire Fly, Double Bonds, Wire Arc Defects, WireResidue. Wire Short, Ball Lift. Tail Lift, Ball Offset, Tail Offset,Driver lC Damage, DriverIC Contamination.
獨特的光學系統(tǒng)和檢測算法，用于高速、高靈敏度的晶體缺陷檢測和分類。
The unique optical system and detection algorithmsare employed for high-speed, high-sensitivity crystal defect detection andclassification.
2D&3D可選，3D測量Z向精度可達8um/ Optional2D &3D。
With 3D measurement achieving Z-axis accuracy up to 8um.
UPH：=5000pcs/h
尺寸/Size: L1000*W800*H1500mm
功率/Power：2KW，AC220V
重量Weight：800KG
AOI金線檢測機用于檢測封裝芯片上的金線連接質量和準確性。
The AOl wire bonding inspection machine is used to detect the quality and accuracy of wire connections onpackaged chips.
使用高分辨率2D/3D相機和AI圖像處理算法，對封裝芯片上的金線連接進行快速、精確的檢測和分析。能夠檢測金線的焊接情況、位置、高度、偏移等參數，識別多種異常或缺陷，如焊接不良、斷裂、偏移等問題。
High-resolution 2D/3D cameras and Al image processing algorithms, the system performs rapid and precisedetection and analysis of wire connections on packaged chips. lt can detect parameters such as wire bondingcondition, position, height, and offset, and identify many anomalies or defects such as poor bonding, breakage or misalignment.
通過及時發(fā)現和修復金線連接的問題，有助于提高封裝芯片的質量和可靠性，降低芯片的不良率。
By promptly identifying and repairing issues with wire connections, it helps to improve the guality and reliabilityof packaged chips, reducing the defect rate of the chips.
